30 November ~ 1 December 2026 - Matsuyama, Ehime, Japan
Software fault prevention, verification, and validation are essential and important approaches to ensuring software productivity, reliability, and qualities. Fault prevention focuses on the issues of how to prevent the introduction and occurrence of faults in software systems. Verification is a means to rigorously check whether software systems satisfy their specification or properties. Validation refers to the technologies and activities for confirming whether the behavior and performance of software systems satisfy the user’s requirements. Various techniques and supporting tools have been developed to fulfill the tasks of software fault prevention, verification, and validation, but many difficulties and open problems remain unaddressed.
This symposium aims to invite researchers and practitioners working on software quality assurance to exchange ideas and to discuss how formal approaches, testing-based approaches, AI approaches, and their combinations can be studied, established, and supported to fulfill the goals of fault prevention, verification, and validation. All people who are interested in the topics mentioned above are welcome to submit papers and to participate in the symposium.
Authors are invited to submit technical papers describing original and unpublished work on, but not limited to, the following topics:
Please contact Dr. Junjun Zheng by email at jzheng@hiroshima-u.ac.jp regarding any issues in relation to registration and payment as well as invitation letter for visa application (if applicable).
1.Each accepted paper for SFPVV2026 symposium must have at least one author registered for SFPVV2026 in the category of Author Registration by the indicated due date. This policy applies to each accepted paper, NOT each author.
2.All the registrations and payments should be made using the online registration system provided in the SFPVV2026 homepage. The online registration supports Credit Card payment only. Not expected, but just in case that the online registration and payment cannot be made for a good reason, other means for payment (wire-transfer, cheque, online-transfer and so on) can be considered. In that case, please contact Dr. Junjun Zheng by email (jzheng@hiroshima-u.ac.jp) as early as possible. Registration can be considered completed only after the full payment has been received.
3.All the fees and payments are in Japanese yen (JPY).
4.Registration cancelation policy: Registration fees will be refunded only if the cancellation request is submitted in writing by email with a good reason and no later than 20th October 2026. Cancellations will be subject to a cancellation fee to cover administrative charges. No refunds will be issued for cancellation requests received after 20th October 2026.
The 3rd International Symposium on Software Fault Prevention, Verification, and Validation (SFPVV 2026) will take place at the Center for Information Technology, Ehime University (CITE). CITE is on the university's Johoku Campus, which is on the north side of Matsuyama Castle, within walking distance of central Matsuyama.
CITE is one of the key departments of the Institute for Development of Digital Human Resources (IDDHR). CITE supports information technology education and academic research activities in Ehime University by managing the university's information infrastructure and network security.
Submission Deadline: 1 September 2026
Notification: 29 September 2026
Camera-ready: 20 October 2026
Submissions: 15 September 2026
Notification: 8 October 2026
Two types of submissions are possible: presentation papers and regular papers. Both types of papers should be written in English. All papers should be submitted using the EasyChair link: here. Accepted presentation papers will not be included in the proceedings of the symposium; only the accepted regular papers will be included in the proceedings, which will be published in the Springer LNCS series. The details of the symposium can be found in the symposium homepage.
Tadashi Dohi, Hiroshima University, Japan
Shaoying Liu (Chair), East China Normal University, China
Geguang Pu, East China Normal University, China
Tatsuhiro Tsuchiya, University of Osaka, Japan
Tadashi Dohi, Hiroshima University, Japan
Hirohisa Aman, Ehime University, Japan
Xi Wang, Shanghai University, China
Junjun Zheng, Hiroshima University, Japan
Hiroshi Takahashi, Ehime University, Japan
Shozo Saeki, Ehime University, Japan
Jingchi Wu, Hiroshima University, Japan
Yamine Ait Ameur, IRIT/INPT-ENSEEIHT, France
Sousuke Amasaki, Nanzan University, Japan
Yoonsik Cheon, University of Texas at El Paso, USA
Yujun Dai, Micron Technology
Mara Downing, University of California Santa Barbara, USA
Dingbang Fang, Fujian Normal University, China
Marc Frappier, Université de Sherbrooke, Canada
Sabine Glesner, Technical University of Berlin, Germany
Kiyoshi Honda, Osaka Institute of Technology, Japan
Rao Lei, Southwest Petroleum University, China
Jiandong Li, Peking University, China
Jingyue Li, Norwegian University of Science and Technology, Norway
Yang Li, Tianjin University, China
Chen-Kai Lin, Academia Sinica, Taiwan
Ai Liu, Nanjing University of Aeronautics and Astronautics, China
Osamu Mizuno, Kyoto Institute of Technology, Japan
Akito Monden, Okayama University, Japan
Hiroyuki Nakagawa, Okayama University, Japan
Shin Nakajima, National Institute of Informatics, Japan
Fumiko Nagoya, Nihon University, Japan
Hiroyuki Okamura, Hiroshima University, Japan
Jun Pang, University of Luxembourg, Luxembourg
Yuji Sato, Hosei University, Japan
Wuwei Shen, Western Michigan University, USA
Xinfeng Shu, Xi'an University of Posts and Telecommunications, China
Tatsuhiro Tsuchiya, University of Osaka, Japan
Masateru Tsunoda, Kindai University, Japan
Pingyan Wang, Guangdong University of Petrochemical Technology, China
Tomoyuki Yokogawa, Okayama Prefectural University, Japan
Zhen You, Jiangxi Normal University, China
Naijun Zhan, Chinese Academy of Sciences, China
Jian Zhang, Chinese Academy of Sciences, China
Jianjun Zhao, Kyushu University, Japan
Junjun Zheng, Hiroshima University, Japan